SEMI International Standards
SEMI New Activity Report Forms (SNARFs)
& SEMI Task Force Organization Forms (TFOFs)

Below you will find the TFOFs of all the task forces actively working in each region. The TFOF contains the charter and purpose of each task force.

The SNARFs that are listed under each task force are the individual activities of the task force. While the majority of these activities lead to the creation or revision of a standard, there are some activities which are focused on exploring and expanding the program.

If you have any further questions on a specific activity, contact your local Standards staff. A listing of global SEMI Standards staff can be found on the contact information page.

Blank forms：
TFOF (DOC 115K) (Sept 2024)
SNARF (DOC 133K) (April 2026)

The listing of SNARFs and TFOFs below are sorted by Global Technical Committee, and then by the region that approved the TFOF.

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Show details for 3D Packaging and Integration3D Packaging and Integration
Show details for Automated Test EquipmentAutomated Test Equipment
Show details for Automation TechnologyAutomation Technology
Show details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Show details for EH&SEH&S
Show details for FacilitiesFacilities
Show details for Flat Panel Display (FPD) - Materials & ComponentsFlat Panel Display (FPD) - Materials & Components
Show details for Flat Panel Display (FPD) - MetrologyFlat Panel Display (FPD) - Metrology
Show details for Flexible Hybrid Electronics (FHE)Flexible Hybrid Electronics (FHE)
Show details for GasesGases
Show details for HB-LEDHB-LED
Hide details for Information & ControlInformation & Control
Show details for ChinaChina
Show details for JapanJapan
Show details for KoreaKorea
Hide details for North AmericaNorth America
Hide details for Advanced Backend Factory IntegrationAdvanced Backend Factory Integration
7213Line Item Revision to SEMI E142-1022 - Specification for Substrate Mapping, SEMI E142.1-0921E — Specification for XML Schema for Substrate Mapping,
SEMI E142.2-1016 — Specification for SECS II Protocol for Substrate Mapping,
SEMI E142.3-1016 — Specification for Web Services for Substrate Mapping,
SEMI E142.4-1022 — Specification for SECS II Protocol for Substrate Mapping Using Item Transfer
7236Line Item Revision to SEMI E90-0921 - Specification for Substrate Tracking and SEMI E90.1-0312 (Reapproved 0921) - Specification for SECS-II Protocol Substrate Tracking
7344Line Item Revision to SEMI E192-0121 – Guide for Equipment Adoption Criteria for GEM and GEM-Related Standards
7380Line Item Revision to SEMI E142-0225 - Specification for Substrate Mapping,
SEMI E142.1-0225 — Specification for XML Schema for Substrate Mapping,
SEMI E142.2-1016 (0225) — Specification for SECS II Protocol for Substrate Mapping,
SEMI E142.3-1016 (0225) — Specification for Web Services for Substrate Mapping,
SEMI E142.4-1022 (0225) — Specification for SECS II Protocol for Substrate Mapping Using Item Transfer
7381Revision to Add a New Subordinate Standard: Specification for Transforming Non-E142 XY Coordinates to SEMI E142-0125: Specification for Substrate Mapping
TFOFAdvanced Backend Factory Integration
Show details for Diagnostic Data Acquisition Task Force NADiagnostic Data Acquisition Task Force NA
Show details for Digital Twins in Manufacturing Task ForceDigital Twins in Manufacturing Task Force
Show details for Energy Saving Equipment Communication Task ForceEnergy Saving Equipment Communication Task Force
Show details for Equipment Data Publication (EDP) Task ForceEquipment Data Publication (EDP) Task Force
Show details for Fab & Equipment Computer and Device Security (CDS) Task ForceFab & Equipment Computer and Device Security (CDS) Task Force
Show details for GEM 300 Task ForceGEM 300 Task Force
Show details for Graphical User Interfaces (GUI) Task ForceGraphical User Interfaces (GUI) Task Force
Show details for NA Information and Control CommitteeNA Information and Control Committee
Show details for Process Control System NAProcess Control System NA
Show details for Sensor Bus Task ForceSensor Bus Task Force
Show details for TaiwanTaiwan
Show details for Liquid ChemicalsLiquid Chemicals
Show details for MEMS / NEMSMEMS / NEMS
Show details for MetricsMetrics
Show details for MicropatterningMicropatterning
Show details for PhotovoltaicPhotovoltaic
Show details for Photovoltaic (PV) - MaterialsPhotovoltaic (PV) - Materials
Show details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Show details for Silicon WaferSilicon Wafer
Show details for TraceabilityTraceability

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