Global Committee Meeting Minutes


SEMI International Standards
Committee Meeting Minutes

Below you will find the committee minutes for all the regional committees within the SEMI Standards Program. These minutes are the official records for all committee and document activity.

Note that the list below is by the Global Technical Committee, with the most recent committee meeting listed first.

Click here to view Committee Meeting Minutes prior to December 31, 2012

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Show details for 3DS-IC3DS-IC
Show details for Assembly & PackagingAssembly & Packaging
Show details for Automated Test EquipmentAutomated Test Equipment
Show details for Automation TechnologyAutomation Technology
Show details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Hide details for EHSEHS
Dec 16, 2016 Japan EHS Available in English
Nov 10, 2016 North America EHS Available in English
Oct 26, 2016 Taiwan EHS Available in EnglishMinutes have not been reviewed
Jul 14, 2016 North America EHS Available in English
Apr 19, 2016 Japan EHS Available in English
Apr 7, 2016 North America EHS Available in English
Nov 5, 2015 North America EHS Available in English
Jul 16, 2015 North America EHS Available in English
Jun 5, 2015 Japan EHS Available in English
Apr 17, 2015 Japan EHS Available in English
Apr 2, 2015 North America EHS Available in English
Dec 5, 2014 Japan EHS Available in English
Nov 6, 2014 North America EHS Available in English
Jul 24, 2014 Japan EHS Available in English
Jul 10, 2014 North America EHS Available in English
Apr 17, 2014 Japan EHS Available in English
Apr 3, 2014 North America EHS Available in English
Apr 1, 2014 Taiwan EHS Available in English
Dec 6, 2013 Japan EHS Available in English
Oct 31, 2013 North America EHS Available in English
Sep 26, 2013 Japan EHS Available in English
Jul 11, 2013 North America EHS Available in English
Apr 18, 2013 Japan EHS Available in English
Apr 4, 2013 North America EHS Available in English
Dec 7, 2012 Japan EHS Available in English
Nov 1, 2012 North America EHS Available in English
Sep 25, 2012 Japan EHS Available in English
Show details for FacilitiesFacilities
Show details for FPD - Materials & ComponentsFPD - Materials & Components
Show details for FPD - MetrologyFPD - Metrology
Show details for GasesGases
Show details for Gases & FacilitiesGases & Facilities
Show details for HB-LEDHB-LED
Show details for Information & ControlInformation & Control
Show details for Liquid ChemicalsLiquid Chemicals
Show details for MEMS / NEMSMEMS / NEMS
Show details for MetricsMetrics
Show details for MicropatterningMicropatterning
Show details for PhotovoltaicPhotovoltaic
Show details for Photovoltaic - AutomationPhotovoltaic - Automation
Show details for Photovoltaic - MaterialsPhotovoltaic - Materials
Show details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Show details for Silicon WaferSilicon Wafer
Show details for TraceabilityTraceability

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