Global Committee Meeting Minutes


SEMI International Standards
Committee Meeting Minutes

Below you will find the committee minutes for all the regional committees within the SEMI Standards Program. These minutes are the official records for all committee and document activity.

Note that the list below is by the Global Technical Committee, with the most recent committee meeting listed first.

Click here to view Committee Meeting Minutes prior to December 31, 2012

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Hide details for 3DS-IC3DS-IC
Nov 4, 2014 North America 3DS-IC Available in EnglishMinutes have not been reviewed
Jul 8, 2014 North America 3DS-IC Available in EnglishMinutes have not been reviewed
Apr 1, 2014 North America 3DS-IC Available in English
Nov 22, 2013 Taiwan 3DS-IC Available in English
Oct 29, 2013 North America 3DS-IC Available in English
Jul 9, 2013 North America 3DS-IC Available in English
Apr 30, 2013 Taiwan 3DS-IC Available in English
Apr 2, 2013 North America 3DS-IC Available in English
Dec 21, 2012 Taiwan 3DS-IC Available in English
Oct 30, 2012 North America 3DS-IC Available in English
Show details for Assembly & PackagingAssembly & Packaging
Show details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Show details for EHSEHS
Show details for FacilitiesFacilities
Show details for FPD - Materials & ComponentsFPD - Materials & Components
Show details for FPD - MetrologyFPD - Metrology
Show details for GasesGases
Show details for Gases & FacilitiesGases & Facilities
Show details for HB-LEDHB-LED
Show details for Information & ControlInformation & Control
Show details for Liquid ChemicalsLiquid Chemicals
Show details for MEMS / NEMSMEMS / NEMS
Show details for MetricsMetrics
Show details for MicropatterningMicropatterning
Show details for PhotovoltaicPhotovoltaic
Show details for Photovoltaic - AutomationPhotovoltaic - Automation
Show details for Photovoltaic - MaterialsPhotovoltaic - Materials
Show details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Show details for Silicon WaferSilicon Wafer
Show details for TraceabilityTraceability

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